A. Hafiane, K. Palaniappan, and G. Seetharaman

Proc. IEEE International Conference on Pattern Recognition (ICPR), 2014

texture, lbp, classification, cbir

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Abstract

This paper addresses the challenging problem of recognition and classification of textured surfaces under illumination variation, geometric transformations and noisy sensor measurements. We propose a new texture operator, Adaptive Median Binary Patterns (AMBP) that extends our previous Median Binary Patterns (MBP) texture feature. The principal idea of AMBP is to hash small local image patches into a binary pattern text on by fusing MBP and Local Binary Patterns (LBP) operators combined with using self-adaptive analysis window sizes to better capture invariant microstructure information while providing robustness to noise. The AMBP scheme is shown to be an effective mechanism for non-parametric learning of spatially varying image texture statistics. The local distribution of rotation invariant and uniform binary pattern subsets extended with more global joint information are used as the descriptors for robust texture classification. The AMBP is shown to outperform recent binary pattern and filtering-based texture analysis methods on two large texture corpora (CUReT and KTH_TIPS2-b) with and without additive noise. The AMBP method is slightly superior to the best techniques in the noiseless case but significantly outperforms other methods in the presence of impulse noise.